Infrared measurement adds important and often revealing data to certain types of R&D analysis, but it hasn't always been easy to incorporate these measurements into experiments and reports. To close that gap, Fluke Corp. has introduced a new software feature that integrates high-resolution thermal data from the company's TiX580, TiX560, TiX1000, TiX660, TiX640 and TiX620, infrared cameras with National Instruments' LabVIEW and MathWorks' MATLAB software, leveraging the strength of those powerful platforms and making it easy to add high-resolution infrared data, video and images to R&D analysis and reporting.